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Embedded Instrument Modules: DMM & LCR & SMU and Automated Test Software

#数据采集#fpga开发

• 6½ Digit Display

• 24-bit Resolution

• 250 kSPS Sampling Rate

• Power and Digital I/O utilize isolated noise reduction technology

Application Scenarios

• High-precision measurement of voltage, current, resistance, inductance, and capacitance

• Diode/Transistor Testing

Channels

1x

2x

2x

2x

Input Impedance

Voltage

10 MΩ

High-Z, 10 MΩ

High-Z

Current

10 Ω

50 mΩ / 2 Ω / 2 KΩ

2 KΩ / 2 MΩ

Input Range

Voltage

± 5 V

0–60 V

± 20 V

Current

± 2 mA

1 nA – 3 A

± 1 mA

Resistance

1 MΩ – 100 MΩ

Coupling

DC

DC

DC

DC

ADC Resolution

24 Bits

24 Bits

24 Bits

24 Bits

Sampling Rate

250 kSPS

250 kSPS

250 kSPS

250 kSPS

Measurement Accuracy

Voltage

± (0.018% of Reading + 0.0015% of F.S.)

6 mVDC:± (0.06% of Reading +0.075% of F.S.)

200 mVDC:± (0.01% of Reading +0.05% of F.S.)

6 VDC:± (0.018% of Reading +0.0013% of F.S.)

2 VDC:± (0.015% of Reading +0.007% of F.S.)

60 VDC:± (0.03% of Reading +0.001% of F.S.)

20 VDC:± (0.01% of Reading +0.003% of F.S.)

6 VAC:± (1% of Reading +0.1% of F.S.)

Current

± (0.06% of Reading + 0.06% of F.S.)

1 uADC:± (0.1% of Reading +0.1% of F.S.)

10 nADC:± (0.05% of Reading +0.1% of F.S.)

100 mADC:± (0.05% of Reading +0.02% of F.S.)

1 uADC:± (0.02% of Reading +0.07% of F.S.)

3 ADC:± (0.1% of Reading +0.02% of F.S.)

1 mADC:± (0.02% of Reading +0.025% of F.S.)

Resistance

1 Ω:± (1% of Reading +0.1% of F.S.)

100 Ω:± (0.05% of Reading +0.2% of F.S.)

1 MΩ:± (0.05% of Reading +0.006% of F.S.)

100 MΩ:± (0.9% of Reading +0.01% of F.S.)

Capacitance

1 nF:± (3% of Reading +0.5% of F.S.)

1 uF:± (2% of Reading +0.1% of F.S.)

500 uF:± (8% of Reading +0.5% of F.S.

Operating Voltage

12 VDC / 5 VDC

12 VDC / 5 VDC

12 VDC / 5 VDC

± 24 V / 3.3 V

Digital Interface

I²C, SPI

I²C, SPI

I²C, SPI

I²C, SPI

Dimensions (mm)

56 × 28 × 13 (S)

100 × 72 × 17 (L)

72 × 48 × 11 (M)

110 × 65 × 13

Automated Test Software

Core Functions

  • Instrument Management
  • Test IP Development and Management
  • Test Plan Development and Management
  • Test Reports

Application Cases

  • FCT (Functional Test)
  • Chip Testing and Module Testing
  • Automated Production Lines

Is a ready-to-execute test execution management software used to organize, control, and execute your automated prototyping, validation, or manufacturing test systems. Archon is the core software of a domestic test operating system.

Software Interface

Automatically discovers instruments and provides simple control and management; Rich system APIs, including connection management APIs, test result judgment APIs, etc., improve development efficiency; Graphical drag-and-drop operations and auto-completion reduce development difficulty; Test cases are saved using CVS and Python, facilitating editing and version management.

Supports distributed deployment, sequential execution, and parallel execution modes, flexibly adapting to various production test scenarios. Test data results can be stored in a database for visual analysis or exported and saved locally using custom templates.