Embedded Instrument Modules: DMM & LCR & SMU and Automated Test Software
• 6½ Digit Display
• 24-bit Resolution
• 250 kSPS Sampling Rate
• Power and Digital I/O utilize isolated noise reduction technology
Application Scenarios
• High-precision measurement of voltage, current, resistance, inductance, and capacitance
• Diode/Transistor Testing
Channels
1x
2x
2x
2x
Input Impedance
Voltage
10 MΩ
High-Z, 10 MΩ
High-Z
Current
10 Ω
50 mΩ / 2 Ω / 2 KΩ
2 KΩ / 2 MΩ
Input Range
Voltage
± 5 V
0–60 V
± 20 V
Current
± 2 mA
1 nA – 3 A
± 1 mA
Resistance
1 MΩ – 100 MΩ
Coupling
DC
DC
DC
DC
ADC Resolution
24 Bits
24 Bits
24 Bits
24 Bits
Sampling Rate
250 kSPS
250 kSPS
250 kSPS
250 kSPS
Measurement Accuracy
Voltage
± (0.018% of Reading + 0.0015% of F.S.)
6 mVDC:± (0.06% of Reading +0.075% of F.S.)
200 mVDC:± (0.01% of Reading +0.05% of F.S.)
6 VDC:± (0.018% of Reading +0.0013% of F.S.)
2 VDC:± (0.015% of Reading +0.007% of F.S.)
60 VDC:± (0.03% of Reading +0.001% of F.S.)
20 VDC:± (0.01% of Reading +0.003% of F.S.)
6 VAC:± (1% of Reading +0.1% of F.S.)
Current
± (0.06% of Reading + 0.06% of F.S.)
1 uADC:± (0.1% of Reading +0.1% of F.S.)
10 nADC:± (0.05% of Reading +0.1% of F.S.)
100 mADC:± (0.05% of Reading +0.02% of F.S.)
1 uADC:± (0.02% of Reading +0.07% of F.S.)
3 ADC:± (0.1% of Reading +0.02% of F.S.)
1 mADC:± (0.02% of Reading +0.025% of F.S.)
Resistance
1 Ω:± (1% of Reading +0.1% of F.S.)
100 Ω:± (0.05% of Reading +0.2% of F.S.)
1 MΩ:± (0.05% of Reading +0.006% of F.S.)
100 MΩ:± (0.9% of Reading +0.01% of F.S.)
Capacitance
1 nF:± (3% of Reading +0.5% of F.S.)
1 uF:± (2% of Reading +0.1% of F.S.)
500 uF:± (8% of Reading +0.5% of F.S.
Operating Voltage
12 VDC / 5 VDC
12 VDC / 5 VDC
12 VDC / 5 VDC
± 24 V / 3.3 V
Digital Interface
I²C, SPI
I²C, SPI
I²C, SPI
I²C, SPI
Dimensions (mm)
56 × 28 × 13 (S)
100 × 72 × 17 (L)
72 × 48 × 11 (M)
110 × 65 × 13
Automated Test Software
Core Functions
- Instrument Management
- Test IP Development and Management
- Test Plan Development and Management
- Test Reports
Application Cases
- FCT (Functional Test)
- Chip Testing and Module Testing
- Automated Production Lines
Is a ready-to-execute test execution management software used to organize, control, and execute your automated prototyping, validation, or manufacturing test systems. Archon is the core software of a domestic test operating system.

Software Interface

Automatically discovers instruments and provides simple control and management; Rich system APIs, including connection management APIs, test result judgment APIs, etc., improve development efficiency; Graphical drag-and-drop operations and auto-completion reduce development difficulty; Test cases are saved using CVS and Python, facilitating editing and version management.

Supports distributed deployment, sequential execution, and parallel execution modes, flexibly adapting to various production test scenarios. Test data results can be stored in a database for visual analysis or exported and saved locally using custom templates.