Reliable and accurate evaluation of blast wave key characteristic parameters is a prerequisite and basis for military operation planning. Test results can provide a reference for warhead design and an effective basis for the R&D and manufacturing of weapon body materials. In recent years, with breakthrough achievements in integrated electronic technology and software systems, blast wave testing technology has achieved stable development.

2.2 Overall Framework of the Test System

2.2.1 System Composition

Traditional data acquisition systems use microcontrollers for software design to control ADCs for acquisition. However, due to the high real-time requirements of blast wave testing, software-controlled methods cannot obtain precise clock signals, and processor speed is often insufficient. Therefore, a suitable controller is required for system design.

Blast wave test systems require high-speed, real-time sampling of high-frequency signals, with high demands on both clock and data acquisition rates. Field-Programmable Gate Arrays (FPGAs) implement functions using hardware logic, achieving speeds comparable to dedicated chips. During the design process, internal PLL cores can generate any desired clock cycle. Furthermore, the hardware parallelism of FPGAs enables synchronous acquisition of multi-channel blast wave signals, thus making FPGAs the chosen system controller. Additionally, FPGAs are programmable, allowing logic design using hardware description language Verilog and program modification based on functional requirements, offering very high flexibility. In this system, FPGAs not only serve a control function but also achieve functions such as